• 比特28

    L-9PD
    Optical communication probe test system
    Integrated design of probe test, reliable test, and higher accuracy
    High-precision four-axis working platform, with high stability and high efficiency considered
    Unique image processing algorithm, high scanning efficiency, and accurate positioning
    Active probe pressure adjustment technology, reliable probe mark control
    pA-level high-precision current source, fully ensuring test accuracy
    Mature light source system (450-1,570nm) covering more devices to be tested
    Multiple IV curve scanning logics to improve test efficiency
    Heating test (optional)
    Support constant parameters and IV-based calculation, covering all PD&APD applications

    Application field

    Optical communication industry

    Main functions
    Automatic BIN classification
    Support connection with MES to automatically load product files
    Automatic regional anomaly retest
    Automatically output activation report
    Re-measurement of an NG point
    Cavity point positioning (0,0)
    Multi-mapping real-time display
    Dynamically associated test items
    Server-side management of product files
    Automatic alignment and fast scanning and positioning
    Real-time display and automatic adjustment of probe pressures by the active edge detector
    Test application
    PD wafer Test
    APD wafer Test
    Consultation/Complaint
    Question Type
    Name
    Phone
    Telephone
    Email
    Gender
    male
    female
    Company Name
    City
    Contact address
    Content
    0755-28938875