比特28

Company Profile

Development History

Wafer Probe station

Die probe station

Exposure machine

Automated Testing

Semiconductor Test

Service Support

Quality Control

Enterprise dynamics

Wafer Probe station Die probe station AOI Sorter Test Handler Bonder Exposure machine

Flip LED test system

A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips

Flip LED test system

A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips

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